| 2008 |
|---|
| 6 | EE | Ramtilak Vemu,
Abhijit Jas,
Jacob A. Abraham,
Srinivas Patil,
Rajesh Galivanche:
A low-cost concurrent error detection technique for processor control logic.
DATE 2008: 897-902 |
| 2007 |
|---|
| 5 | EE | Rajesh Galivanche,
Rohit Kapur,
Antonio Rubio:
Testing in the year 2020.
DATE 2007: 960-965 |
| 2006 |
|---|
| 4 | EE | Rajesh Galivanche,
Bob Gottlieb:
Session Abstract.
VTS 2006: 422-423 |
| 2004 |
|---|
| 3 | EE | Sandip Kundu,
T. M. Mak,
Rajesh Galivanche:
Trends in manufacturing test methods and their implications.
ITC 2004: 679-687 |
| 2003 |
|---|
| 2 | EE | Bill Grundmann,
Rajesh Galivanche,
Sandip Kundu:
Circuit and Platform Design Challenges in Technologies beyond 90nm.
DATE 2003: 10044-10049 |
| 2001 |
|---|
| 1 | EE | Sandip Kundu,
Sujit T. Zachariah,
Sanjay Sengupta,
Rajesh Galivanche:
Test Challenges in Nanometer Technologies.
J. Electronic Testing 17(3-4): 209-218 (2001) |
