| 2003 |
|---|
| 9 | EE | Teresa L. McLaurin,
Frank Frederick,
Rich Slobodnik:
The Testability Features of The ARM1026EJ Microprocessor Core.
ITC 2003: 773-782 |
| 2002 |
|---|
| 8 | EE | Teresa L. McLaurin:
TAPS All Over My Chips.
ITC 2002: 1193-1194 |
| 7 | EE | Teresa L. McLaurin,
Souvik Ghosh:
ETM10 Incorporates Hardware Segment of IEEE P1500.
IEEE Design & Test of Computers 19(3): 8-13 (2002) |
| 6 | EE | Erik Jan Marinissen,
Rohit Kapur,
Maurice Lousberg,
Teresa L. McLaurin,
Mike Ricchetti,
Yervant Zorian:
On IEEE P1500's Standard for Embedded Core Test.
J. Electronic Testing 18(4-5): 365-383 (2002) |
| 2001 |
|---|
| 5 | EE | Dwayne Burek,
Garen Darbinyan,
Rohit Kapur,
Maurice Lousberg,
Teresa L. McLaurin,
Mike Ricchetti:
IP and Automation to Support IEEE P1500.
VTS 2001: 411-412 |
| 2000 |
|---|
| 4 | | Teresa L. McLaurin,
John C. Potter:
On-the-shelf core pattern methodology for ColdFire(R) microprocessor cores.
ITC 2000: 1100-1107 |
| 3 | | Teresa L. McLaurin,
Frank Frederick:
The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core.
ITC 2000: 151-159 |
| 2 | EE | Alfred L. Crouch,
Michael Mateja,
Teresa L. McLaurin,
John C. Potter,
Dat Tran:
Test Development for a Third-Version ColdFire Microprocessor.
IEEE Design & Test of Computers 17(4): 29-37 (2000) |
| 1999 |
|---|
| 1 | | Alfred L. Crouch,
Michael Mateja,
Teresa L. McLaurin,
John C. Potter,
Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors.
ITC 1999: 913-922 |
