Maurice Lousberg

2007
16	EE	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150
15	EE	Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166
14	EE	Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation CoRR abs/0710.4693: (2007)
2005
13	EE	Tom Waayers, Erik Jan Marinissen, Maurice Lousberg: IEEE Std 1500 Compliant Infrastructure forModular SOC Testing. Asian Test Symposium 2005: 450
12	EE	Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE 2005: 438-443
11	EE	Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg: A New Algorithm for Dynamic Faults Detection in RAMs. VTS 2005: 177-182
2003
10	EE	Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger: Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS 2003: 345-350
9	EE	Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electronic Testing 19(4): 369-376 (2003)
2002
8	EE	Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: An Effective Diagnosis Method to Support Yield Improvement. ITC 2002: 260-269
7	EE	Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian: On IEEE P1500's Standard for Embedded Core Test. J. Electronic Testing 18(4-5): 365-383 (2002)
2001
6		Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay: CTL the language for describing core-based test. ITC 2001: 131-139
5	EE	Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti: IP and Automation to Support IEEE P1500. VTS 2001: 411-412
2000
4		Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel: Wrapper design for embedded core test. ITC 2000: 911-920
3		Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg: Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? ITC 2000: 95-104
1999
2		Alex Biewenga, Henk D. L. Hollmann, Frans de Jong, Maurice Lousberg: Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC 1999: 439-448
1998
1	EE	Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters: A structured and scalable mechanism for test access to embedded reusable cores. ITC 1998: 284-293

Coauthor Index

1	Robert G. J. Arendsen	[1]
2	Daniel Arumí	[15] [16]
3	Mohamed Azimane	[11] [12] [14]
4	Keith Baker	[3]
5	Alex Biewenga	[2]
6	Gerard Bos	[1]
7	Fred Bowen	[12] [14]
8	Dwayne Burek	[5]
9	Garen Darbinyan	[5]
10	Hans Dingemanse	[1]
11	Stefan Eichenberger	[8] [9] [10] [12] [14] [15] [16]
12	Joan Figueras	[15] [16]
13	Sandeep Kumar Goel	[4]
14	Guido Gronthoud	[3] [10] [11] [12] [14]
15	Henk D. L. Hollmann	[2]
16	Camelia Hora	[8] [9] [10] [15] [16]
17	Frans de Jong	[2]
18	Rohit Kapur	[5] [6] [7]
19	Douglas Kay	[6]
20	Brion L. Keller	[6]
21	Bram Kruseman	[15] [16]
22	Ananta K. Majhi	[10] [11] [12] [14] [15] [16]
23	Erik Jan Marinissen	[1] [4] [7] [13]
24	Teresa L. McLaurin	[5] [7]
25	Will Moore	[3]
26	Paul Reuter	[6]
27	Mike Ricchetti	[5] [7]
28	Rosa Rodríguez-Montañés	[15] [16]
29	Rene Segers	[8] [9]
30	Tony Taylor	[6]
31	Pop Valer	[10]
32	Tom Waayers	[13]
33	Clemens Wouters	[1]
34	Yervant Zorian	[4] [7]