2008 |
20 | EE | Francesc Moll,
Joan Figueras,
Antonio Rubio:
Data Dependence of Delay Distribution for a Planar Bus.
PATMOS 2008: 409-418 |
2007 |
19 | EE | Rajesh Galivanche,
Rohit Kapur,
Antonio Rubio:
Testing in the year 2020.
DATE 2007: 960-965 |
2006 |
18 | EE | Arindam Calomarde,
Diego Mateo,
Antonio Rubio:
High level spectral-based analysis of power consumption in DSPs systems.
ISCAS 2006 |
2005 |
17 | EE | Johan Lambie,
Francesc Moll Echeto,
José Luis González,
Antonio Rubio:
Asynchronous pulse logic cell for threshold logic and Boolean networks.
ISCAS (1) 2005: 460-463 |
16 | EE | Arindam Calomarde,
Antonio Rubio,
Jordi Saludes:
Selective Clock-Gating for Low-Power Synchronous Counters.
J. Low Power Electronics 1(3): 217-225 (2005) |
15 | EE | Miguel A. Méndez,
José Luis González,
Diego Mateo,
Antonio Rubio:
An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits.
Microelectronics Journal 36(1): 77-84 (2005) |
2004 |
14 | EE | Josep Altet,
Antonio Rubio,
M. Amine Salhi,
J. L. Gálvez,
Stefan Dilhaire,
Ashish Syal,
André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing.
VTS 2004: 179-184 |
13 | EE | Josep Altet,
J. M. Rampnoux,
Jean-Christophe Batsale,
Stefan Dilhaire,
Antonio Rubio,
Wilfrid Claeys,
Stéphane Grauby:
Applications of temperature phase measurements to IC testing.
Microelectronics Reliability 44(1): 95-103 (2004) |
12 | EE | Javier Ramírez,
José C. Segura,
Carmen Benítez,
Ángel de la Torre,
Antonio Rubio:
Efficient voice activity detection algorithms using long-term speech information.
Speech Communication 42(3-4): 271-287 (2004) |
2002 |
11 | EE | Xavier Aragonès,
José Luis González,
Francesc Moll,
Antonio Rubio:
Noise Generation and Coupling Mechanisms in Deep-Submicron ICs.
IEEE Design & Test of Computers 19(5): 27-35 (2002) |
2000 |
10 | EE | Josep Altet,
Antonio Rubio,
E. Schaub,
Stefan Dilhaire,
Wilfrid Claeys:
Thermal Testing: Fault Location Strategies.
VTS 2000: 189-194 |
1999 |
9 | EE | Josep Altet,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire,
E. Schaub,
Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility.
J. Electronic Testing 14(1-2): 57-66 (1999) |
1997 |
8 | EE | Josep Altet,
Antonio Rubio,
Hideo Tamamoto:
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.
Asian Test Symposium 1997: 149-154 |
7 | EE | Josep Altet,
Antonio Rubio:
Differential Sensing Strategy for Dynamic Thermal Testing of ICs.
VTS 1997: 434-439 |
1995 |
6 | | Douglas Reed,
Jason Doege,
Antonio Rubio:
Improving Board and System Test: A Proposal to Integrate Boundary Scan and IDDQ.
ITC 1995: 577-585 |
5 | EE | Miquel Roca,
Antonio Rubio:
Current testability analysis of feedback bridging faults in CMOS circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(10): 1299-1305 (1995) |
1994 |
4 | | C. Ferrer,
D. Dateo,
J. Oliver,
Antonio Rubio,
M. Rullán:
An Approach to the Development of a IDDQ Testable Cell Library.
DFT 1994: 46-54 |
3 | EE | Víctor H. Champac,
Antonio Rubio,
Joan Figueras:
Electrical model of the floating gate defect in CMOS ICs: implications on IDDQ testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 359-369 (1994) |
2 | EE | Antonio Rubio,
Noriyoshi Itazaki,
Xiaole Xu,
Kozo Kinoshita:
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 387-395 (1994) |
1993 |
1 | | Víctor H. Champac,
Antonio Rubio,
Joan Figueras:
Analysis of the Floating Gate Defect in CMOS.
DFT 1993: 101-108 |