2004 |
5 | EE | Jim Sproch:
A Little DFT Goes a Long Way When Testing Multi-Gb/s I/O Signals.
ITC 2004: 1437 |
2003 |
4 | EE | Nahmsuk Oh,
Rohit Kapur,
Thomas W. Williams,
Jim Sproch:
Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture.
DATE 2003: 10110-10115 |
2002 |
3 | EE | J. Borel,
Anand Raghunathan,
Jim Sproch,
Michael Howells,
Janusz Rajski:
Innovations in Test Automation.
VTS 2002: 43-46 |
2000 |
2 | EE | Michael Münch,
Norbert Wehn,
Bernd Wurth,
Renu Mehra,
Jim Sproch:
Automating RT-Level Operand Isolation to Minimize Power Consumption in Datapaths.
DATE 2000: 624- |
1997 |
1 | EE | Jim Burr,
Anantha Chandrakasan,
Fari Assaderaghi,
Francky Catthoor,
Frank Fox,
Dave Greenhill,
Deo Singh,
Jim Sproch:
Low power design without compromise (panel).
ISLPED 1997: 293-294 |