| 2004 |
|---|
| 5 | EE | R. Dean Adams,
Robert Abbott,
Xiaoliang Bai,
Dwayne Burek,
Eric MacDonald:
An Integrated Memory Self Test and EDA Solution.
MTDT 2004: 92-95 |
| 2002 |
|---|
| 4 | EE | Kazuhiko Iijima,
Armagan Akar,
Charlie McDonald,
Dwayne Burek:
Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips.
Asian Test Symposium 2002: 311-316 |
| 2001 |
|---|
| 3 | EE | Dwayne Burek,
Garen Darbinyan,
Rohit Kapur,
Maurice Lousberg,
Teresa L. McLaurin,
Mike Ricchetti:
IP and Automation to Support IEEE P1500.
VTS 2001: 411-412 |
| 1994 |
|---|
| 2 | EE | Benoit Nadeau-Dostie,
Dwayne Burek,
Abu S. M. Hassan:
ScanBist: A Multifrequency Scan-Based BIST Method.
IEEE Design & Test of Computers 11(1): 7-17 (1994) |
| 1992 |
|---|
| 1 | | Benoit Nadeau-Dostie,
Dwayne Burek,
Abu S. M. Hassan:
ScanBIST: A Multi-frequency Scan-based BIST Method.
ITC 1992: 506-513 |
