Volume 14,
Number 1,
January-March 1997
EIC Message
- Keeping in touch: Reader survey results; planned e-mail survey.
4-5 BibTeX
Interview-Design data standard
News-JOLLY,
BIST for embedded DRAM
Guest Editor's Introduction
- Marc E. Levitt:
Guest Editor's Introduction: Microprocessors Lead the Way in Complex Design.
8-9 BibTeX
Ultrasparc Testability
Memory Defect Mapping
Features
Special Features
A D&T Roundtable
Panel Summaries-Asynchronous design,
Intranets and EDA
Conference Reports-ATS 96,
System Test Standards Committee
- Conference Reports.
88-90 BibTeX
DATC Newsletter
- Design Automation Technical Committee Newsletter.
92-93 BibTeX
TTTC Newsletter
- Test Technology Tc Newsletter.
94-95 BibTeX
The Last Byte-Teaching George about test
Volume 14,
Number 2,
April-June 1997
Letters
- VHDL fault injection questioned.
2-3 BibTeX
News
Panel Summaries
A D&T Profile
Guest Editors' Introduction
Cosimulation and Compilation
Ram Address Decoders
Microsystem Cad
High-Level Synthesis
Features
Parity Prediction
Digital System Design
A D&T Roundtable
Author Guidelines
- Author Guidelines IEEE Design & Test.
90-91 BibTeX
DATC Newsletter
- Design Automation Technical Committee Newsletter.
93- BibTeX
TTTC Newsletter
- Test Technology TC Newsletter.
94-95 BibTeX
The Last Byte
Volume 14,
Number 3,
July-September 1997
EIC Message-Welcome ITC 97 Attendees
- About this super issue.
1- BibTeX
News
Panel Summaries
Conference Reports
- Conference Reports.
8-10 BibTeX
VTS 97 Keynote
Guest Editors' Introduction
Feature
IC Diagnosis and Failure Analysis
- Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson:
IC Failure Analysis: Magic, Mystery, and Science.
59-69
Electronic Edition (link) BibTeX
- Donald Staab, Eugene R. Hnatek:
Diagnosing IC Failures in a Fast Environment.
70-75
Electronic Edition (link) BibTeX
- David P. Vallett:
IC Failure Analysis: The Importance of Test and Diagnostics.
76-82
Electronic Edition (link) BibTeX
- Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena:
Automated Diagnosis in Testing and Failure Analysis.
83-89
Electronic Edition (link) BibTeX
- Keith Baker, Jos van Beers:
Shmoo Plotting: The Black Art of IC Testing.
90-97
Electronic Edition (link) BibTeX
- Robert C. Aitken:
Modeling the Unmodelable: Algorithmic Fault Diagnosis.
98-103
Electronic Edition (link) BibTeX
Special Feature
DATC Newsletter
- Design Automation Technical Committee Newsletter.
123-125 BibTeX
TTTC Newsletter
- Test Technology Tc Newsletter.
126-127 BibTeX
The Last Byte
Volume 14,
Number 4,
October-December 1997
Message from the EIC
- D&T to greet new EIC.
1- BibTeX
Panel Summaries
Conference Reports
- Conference Reports.
5-6 BibTeX
A D&T Profile
Guest Editors' Introduction
Feature
- Rajesh K. Gupta, Yervant Zorian:
Introducing Core-Based System Design.
15-25
Electronic Edition (link) BibTeX
- Ann Marie Rincon, Cory Cherichetti, James A. Monzel, David R. Stauffer, Michael T. Trick:
Core Design and System-on-a-Chip Integration.
26-35
Electronic Edition (link) BibTeX
- Frank S. Eory:
A Core-Based System-to-Silicon Design Methodology.
36-41
Electronic Edition (link) BibTeX
- Vijay K. Madisetti, Lan Shen:
Interface Design for Core-Based Systems.
42-51
Electronic Edition (link) BibTeX
- Nur A. Touba, Bahram Pouya:
Using Partial Isolation Rings to Test Core-Based Designs.
52-59
Electronic Edition (link) BibTeX
- Mika Kuulusa, Jari Nurmi, Janne Takala, Pasi Ojala, Henrik Herranen:
A Flexible DSP Core for Embedded Systems.
60-68
Electronic Edition (link) BibTeX
- Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto, Enrico Macii, Massimo Poncino:
Testing Core-Based Systems: A Symbolic Methodology.
69-77
Electronic Edition (link) BibTeX
Special Feature
IEEE Design & Test of Computers:
1997 Annual Index,
Volume 14
- IEEE Design & Test of Computers: 1997 Annual Index, Volume 14.
103-107 BibTeX
DDATC Newsletter
- DDATC Newsletter.
108-109 BibTeX
TTTC Newsletter
- Tttc Newsletter.
110-111 BibTeX
The Last Byte
Copyright © Sat May 16 23:57:38 2009
by Michael Ley (ley@uni-trier.de)
