Emmanuel Rondey

2002
2	EE	Emmanuel Rondey, Yann Tellier, Simone Borri: A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW 2002: 251-255
1	EE	Emmanuel Rondey, Yann Tellier, Simone Borri: A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. MTDT 2002: 57-61

Coauthor Index

1	Simone Borri	[1] [2]
2	Yann Tellier	[1] [2]