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Emmanuel Rondey

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2002
2EEEmmanuel Rondey, Yann Tellier, Simone Borri: A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW 2002: 251-255
1EEEmmanuel Rondey, Yann Tellier, Simone Borri: A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. MTDT 2002: 57-61

Coauthor Index

1Simone Borri [1] [2]
2Yann Tellier [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)