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Raoul Velazco

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2005
28EERaoul Velazco, R. Ecoffet, F. Faure: How to Characterize the Problem of SEU in Processors and Representative Errors Observed on Flight. IOLTS 2005: 303-308
2004
27EELorena Anghel, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero, Raoul Velazco: Coupling Different Methodologies to Validate Obsolete Microprocessors. DFT 2004: 250-255
26EEB. Nicolescu, Yvon Savaria, Raoul Velazco: Performance Evaluation and Failure Rate Prediction for the Soft Implemented Error Detection Technique. IOLTS 2004: 233-238
25EEHaissam Ziade, Rafic A. Ayoubi, Raoul Velazco: A Survey on Fault Injection Techniques. Int. Arab J. Inf. Technol. 1(2): 171-186 (2004)
2003
24EEB. Nicolescu, Raoul Velazco: Detecting Soft Errors by a Purely Software Approach: Method, Tools and Experimental Results. DATE 2003: 20057-20063
23EEB. Nicolescu, P. Peronnard, Raoul Velazco, Yvon Savaria: Efficiency of Transient Bit-Flips Detection by Software Means: A Complete Study. DFT 2003: 377-384
22EELorena Anghel, Raoul Velazco, S. Saleh, S. Deswaertes, A. El Moucary: Preliminary Validation of an Approach Dealing with Processor Obsolescence. DFT 2003: 493-
21EEB. Nicolescu, Yvon Savaria, Raoul Velazco: SIED: Software Implemented Error Detection. DFT 2003: 589-596
20EEMonica Alderighi, Fabio Casini, Sergio D'Angelo, F. Faure, Marcello Mancini, Sandro Pastore, Giacomo R. Sechi, Raoul Velazco: Radiation test methodology for SRAM-based FPGAs by using THESIC. IOLTS 2003: 162
19EERaoul Velazco, Lorena Anghel, S. Saleh: A Methodology for Test Replacement Solutions of Obsolete Processors. IOLTS 2003: 209-213
18EERaoul Velazco, Sana Rezgui, Haissam Ziade: Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied. J. Electronic Testing 19(1): 83-90 (2003)
2002
17EERaoul Velazco, A. Corominas, P. Ferreyra: Injecting Bit Flip Faults by Means of a Purely Software Approach: A Case Studied. DFT 2002: 108-116
16EEGian-Carlo Cardarilli, F. Kaddour, A. Leandri, Marco Ottavi, Salvatore Pontarelli, Raoul Velazco: Bit Flip Injection in Processor-Based Architectures: A Case Study. IOLTW 2002: 117-
15EEFernanda Gusmão de Lima, Luigi Carro, Raoul Velazco, Ricardo Augusto da Luz Reis: Injecting Multiple Upsets in a SEU Tolerant 8051 Micro-Controller. IOLTW 2002: 194
14EEF. Kaddour, Sana Rezgui, Raoul Velazco, S. Rodriguez, J. R. De Mingo: Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach. IOLTW 2002: 195
2001
13EEPh. Cheynet, B. Nicolescu, Raoul Velazco, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante: System safety through automatic high-level code transformations: an experimental evaluation. DATE 2001: 297-301
12EERaoul Velazco, Régis Leveugle, O. Calvo: Upset-Like Fault Injection in VHDL Descriptions: A Method and Preliminary Results. DFT 2001: 259-
11EEB. Nicolescu, Raoul Velazco, Matteo Sonza Reorda: Effectiveness and Limitations of Various Software Techniques for "Soft Error" Detection: A Comparative Study. IOLTW 2001: 172-177
10EEÉrika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis: Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. J. Electronic Testing 17(2): 149-161 (2001)
2000
9EEMaurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, Ph. Cheynet, B. Nicolescu, Raoul Velazco: Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures. IOLTW 2000: 17-
8EEFabian Vargas, Alexandre M. Amory, Raoul Velazco: Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL. IOLTW 2000: 67-72
7EERaoul Velazco, Sana Rezgui: Transient Bitflip Injection in Microprocessor Embedded Applications. IOLTW 2000: 80-
1999
6 Raoul Velazco, Ch. Godin, Ph. Cheynet, Santiago Torres-Alegre, Diego Andina, M. B. Gordon: Study of Two ANN Digital Implementations of a Radar Detector Candidate to an On-Board Satellite Experiment. IWANN (2) 1999: 615-624
1997
5 Jean-Denis Muller, Ph. Cheynet, Raoul Velazco: Analysis and Improvement of Neural Network Robustness for On-Board Satellite Image Processing. ICANN 1997: 1211-1216
1991
4 P. Caspi, J. Piotrowski, Raoul Velazco: An A Priori Approach to the Evaluation of Signature Analysis Efficiency. IEEE Trans. Computers 40(9): 1068-1071 (1991)
1988
3 C. Bellon, Raoul Velazco, Haissam Ziade: Analysis of Experimental Results on Functional Testing and Diagnosis of Complex Circuits. ITC 1988: 64-72
1985
2 Raoul Velazco, Haissam Ziade, E. Kolokithas: A Microprocessor Test Approach Allowing Fault Localization. ITC 1985: 737-743
1984
1 C. Bellon, Raoul Velazco: Hardware and Software Tools for Microprocessor Functional Test. ITC 1984: 804-820

Coauthor Index

1Monica Alderighi [20]
2Alexandre M. Amory [8]
3Diego Andina [6]
4Lorena Anghel [19] [22] [27]
5Rafic A. Ayoubi [25]
6C. Bellon [1] [3]
7O. Calvo [12]
8Gian-Carlo Cardarilli [16]
9Luigi Carro [10] [15]
10Fabio Casini [20]
11P. Caspi [4]
12Ph. Cheynet [5] [6] [9] [13]
13A. Corominas [17]
14Érika F. Cota [10]
15Sergio D'Angelo [20]
16S. Deswaertes [22]
17R. Ecoffet [28]
18F. Faure [20] [28]
19P. Ferreyra [17]
20Ch. Godin [6]
21M. B. Gordon [6]
22F. Kaddour [14] [16]
23Fernanda Gusmão de Lima Kastensmidt (Fernanda Gusmão de Lima, Fernanda Lima Kastensmidt) [15]
24E. Kolokithas [2]
25A. Leandri [16]
26Régis Leveugle [12]
27Fernanda Lima [10]
28Marcelo Lubaszewski [10]
29Marcello Mancini [20]
30J. R. De Mingo [14]
31A. El Moucary [22]
32Jean-Denis Muller [5]
33B. Nicolescu [9] [11] [13] [21] [23] [24] [26]
34Marco Ottavi [16]
35Sandro Pastore [20]
36P. Peronnard [23]
37J. Piotrowski [4]
38Salvatore Pontarelli [16]
39Maurizio Rebaudengo [9] [13]
40Ricardo Augusto da Luz Reis (Ricardo A. L. Reis, Ricardo Reis) [10] [15]
41Matteo Sonza Reorda [9] [11] [13] [27]
42Sana Rezgui [7] [10] [14] [18]
43S. Rodriguez [14]
44S. Saleh [19] [22]
45Ernesto Sánchez (Edgar Ernesto Sánchez Sánchez) [27]
46Yvon Savaria [21] [23] [26]
47Giacomo R. Sechi [20]
48Giovanni Squillero [27]
49Santiago Torres-Alegre [6]
50Fabian Vargas [8]
51Massimo Violante [9] [13]
52Haissam Ziade [2] [3] [18] [25]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)