Eugeni Isern

2009
16	EE	Eugeni García-Moreno, Kay Suenaga, Rodrigo Picos, Sebastià A. Bota, Miquel Roca, Eugeni Isern: Predictive test strategy for CMOS RF mixers. Integration 42(1): 95-102 (2009)
2007
15	EE	Kay Suenaga, Rodrigo Picos, Sebastià A. Bota, Miquel Roca, Eugeni Isern, Eugenio García: A Module for BiST of CMOS RF Receivers. J. Electronic Testing 23(6): 605-612 (2007)
2004
14	EE	Rodrigo Picos, Miquel Roca, Eugeni Isern, Sebstatià A. Bota, Eugenio García: On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA. IOLTS 2004: 179
2003
13	EE	Rodrigo Picos, Joan Font, Eugeni Isern, Miquel Roca, Eugenio García: A Configurable Built in Current Sensor for Mixed Signal Circuit Testing. IOLTS 2003: 167
12	EE	Eugeni Isern, Miquel Roca, Francesc Moll: Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits. PATMOS 2003: 481-490
11	EE	Joan Font, J. Ginard, Rodrigo Picos, Eugeni Isern, Jaume Segura, Miquel Roca, Eugenio García: A BICS for CMOS OpAmps by Monitoring the Supply Current Peak. J. Electronic Testing 19(5): 597-603 (2003)
10	EE	Joan Font, Rodrigo Picos, Miquel Roca, Eugeni Isern, Eugeni García-Moreno: A new BICS for CMOS operational amplifiers by using oscillation test techniques. Microelectronics Journal 34(10): 919-926 (2003)
9	EE	Francesc Moll, Miquel Roca, Eugeni Isern: Analysis of dissipation energy of switching digital CMOS gates with coupled outputs. Microelectronics Journal 34(9): 833-842 (2003)
2002
8	EE	Joan Font, J. Ginard, Eugeni Isern, Miquel Roca, Jaume Segura, Eugenio García: A BICS for CMOS Opamps by Monitoring the Supply Current Peak. IOLTW 2002: 94-98
2000
7	EE	Rodrigo Picos, Miquel Roca, Eugeni Isern, Jaume Segura, Eugeni García-Moreno: Experimental Results on BIC Sensors for Transient Current Testing. J. Electronic Testing 16(3): 235-241 (2000)
1999
6	EE	Eugeni Isern, Miquel Roca, Jaume Segura: Analyzing the Need for ATPG Targeting GOS Defects. VTS 1999: 420-425
1998
5	EE	Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: IDDQ testing: state of the art and future trends. Integration 26(1-2): 167-196 (1998)
4	EE	Eugenio García Moreno, Benjamín Iñíguez, Miquel Roca, Jaume Segura, Eugeni Isern: Clocked Dosimeter Compatible with Digital CMOS Technology. J. Electronic Testing 12(1-2): 101-110 (1998)
1995
3	EE	Eugeni Isern, Joan Figueras: IDDQ Test and Diagnosis of CMOS Circuits. IEEE Design & Test of Computers 12(4): 60-67 (1995)
1994
2		Eugeni Isern, Joan Figueras: Test of Bridging Faults in Scan-based Sequential Circuits. EDAC-ETC-EUROASIC 1994: 366-370
1993
1		Eugeni Isern, Joan Figueras: Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits. ITC 1993: 73-82

Coauthor Index

1	Sebastià A. Bota	[15] [16]
2	Sebstatià A. Bota	[14]
3	Antoni Ferré	[5]
4	Joan Figueras	[1] [2] [3] [5]
5	Joan Font	[8] [10] [11] [13]
6	Eugenio García	[8] [11] [13] [14] [15]
7	Eugeni García-Moreno	[7] [10] [16]
8	J. Ginard	[8] [11]
9	Benjamín Iñíguez	[4]
10	Francesc Moll	[9] [12]
11	Eugenio García Moreno	[4]
12	Rodrigo Picos	[7] [10] [11] [13] [14] [15] [16]
13	Josep Rius	[5]
14	Miquel Roca	[4] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16]
15	Rosa Rodríguez-Montañés	[5]
16	Jaume Segura	[4] [6] [7] [8] [11]
17	Kay Suenaga	[15] [16]