Davide Appello

2007
13	EE	Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda: An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT 2007: 291-300
2006
12	EE	Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171
11	EE	Davide Appello: Session Abstract. VTS 2006: 240-241
10	EE	Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda: System-in-Package Testing: Problems and Solutions. IEEE Design & Test of Computers 23(3): 203-211 (2006)
2004
9	EE	Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre: Yield Analysis of Logic Circuits. VTS 2004: 103-108
8	EE	Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew: Understanding Yield Losses in Logic Circuits. IEEE Design & Test of Computers 21(3): 208-215 (2004)
7	EE	Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electronic Testing 20(1): 79-87 (2004)
2003
6	EE	Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante: Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385
2002
5	EE	Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW 2002: 206-210
4	EE	Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello: High Accuracy Stimulus Generation for A/D Converter BIST. ITC 2002: 1031-1039
3	EE	Davide Appello: The Yield of Test Outsourcing. ITC 2002: 1215
2	EE	Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT 2002: 12-16
2001
1	EE	Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda: A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium 2001: 97-102

Coauthor Index

1	Paolo Bernardi	[6] [7] [10] [12] [13]
2	Fulvio Corno	[1] [2] [5] [7]
3	Alessandra Fudoli	[2] [4] [5] [6] [7] [8] [9]
4	Katia Giarda	[8] [9]
5	M. Giovinetto	[1]
6	Emil Gizdarski	[8] [9]
7	Michelangelo Grosso	[10] [12] [13]
8	Jorge Luis Lagos-Benites	[13]
9	Ben Mathew	[8] [9]
10	Danilo Ravotto	[13]
11	Maurizio Rebaudengo	[1] [2] [5] [6] [7] [12]
12	Matteo Sonza Reorda	[1] [2] [5] [6] [7] [10] [12] [13]
13	Aubin Roy	[4]
14	Edgar E. Sánchez	[13]
15	Stephen K. Sunter	[4]
16	Vincenzo Tancorre	[2] [5] [6] [7] [8] [9] [12]
17	Massimo Violante	[6]