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Davide Appello

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2007
13EEJorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda: An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT 2007: 291-300
2006
12EEDavide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171
11EEDavide Appello: Session Abstract. VTS 2006: 240-241
10EEDavide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda: System-in-Package Testing: Problems and Solutions. IEEE Design & Test of Computers 23(3): 203-211 (2006)
2004
9EEDavide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre: Yield Analysis of Logic Circuits. VTS 2004: 103-108
8EEDavide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew: Understanding Yield Losses in Logic Circuits. IEEE Design & Test of Computers 21(3): 208-215 (2004)
7EEDavide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electronic Testing 20(1): 79-87 (2004)
2003
6EEDavide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante: Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385
2002
5EEDavide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW 2002: 206-210
4EEAubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello: High Accuracy Stimulus Generation for A/D Converter BIST. ITC 2002: 1031-1039
3EEDavide Appello: The Yield of Test Outsourcing. ITC 2002: 1215
2EEDavide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT 2002: 12-16
2001
1EEDavide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda: A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium 2001: 97-102

Coauthor Index

1Paolo Bernardi [6] [7] [10] [12] [13]
2Fulvio Corno [1] [2] [5] [7]
3Alessandra Fudoli [2] [4] [5] [6] [7] [8] [9]
4Katia Giarda [8] [9]
5M. Giovinetto [1]
6Emil Gizdarski [8] [9]
7Michelangelo Grosso [10] [12] [13]
8Jorge Luis Lagos-Benites [13]
9Ben Mathew [8] [9]
10Danilo Ravotto [13]
11Maurizio Rebaudengo [1] [2] [5] [6] [7] [12]
12Matteo Sonza Reorda [1] [2] [5] [6] [7] [10] [12] [13]
13Aubin Roy [4]
14Edgar E. Sánchez [13]
15Stephen K. Sunter [4]
16Vincenzo Tancorre [2] [5] [6] [7] [8] [9] [12]
17Massimo Violante [6]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)