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Nadir Z. Basturkmen

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2008
7EEKing Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman: Diagnosis of Scan Clock Failures. VTS 2008: 67-72
2003
6EENadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz: A Low Power Pseudo-Random BIST Technique. J. Electronic Testing 19(6): 637-644 (2003)
2002
5EENadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz: A Low Power Pseudo-Random BIST Technique. ICCD 2002: 468-473
4EENadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz: A Low Power Pseudo-Random BIST Technique. IOLTW 2002: 140-
3EENadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz: Pseudo Random Patterns Using Markov Sources for Scan BIST. ITC 2002: 1013-1021
2EENadir Z. Basturkmen, Sudhakar M. Reddy, Janusz Rajski: Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST. VLSI Design 2002: 604-
1999
1EESudhakar M. Reddy, Irith Pomeranz, Nadir Z. Basturkmen, Xijiang Lin: Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential Circuits. VTS 1999: 275-283

Coauthor Index

1King Leong Lee [7]
2Xijiang Lin [1]
3Irith Pomeranz [1] [3] [4] [5] [6]
4Janusz Rajski [2]
5Sudhakar M. Reddy [1] [2] [3] [4] [5] [6]
6Srikanth Venkataraman [7]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)