| 2008 |
|---|
| 7 | EE | King Leong Lee,
Nadir Z. Basturkmen,
Srikanth Venkataraman:
Diagnosis of Scan Clock Failures.
VTS 2008: 67-72 |
| 2003 |
|---|
| 6 | EE | Nadir Z. Basturkmen,
Sudhakar M. Reddy,
Irith Pomeranz:
A Low Power Pseudo-Random BIST Technique.
J. Electronic Testing 19(6): 637-644 (2003) |
| 2002 |
|---|
| 5 | EE | Nadir Z. Basturkmen,
Sudhakar M. Reddy,
Irith Pomeranz:
A Low Power Pseudo-Random BIST Technique.
ICCD 2002: 468-473 |
| 4 | EE | Nadir Z. Basturkmen,
Sudhakar M. Reddy,
Irith Pomeranz:
A Low Power Pseudo-Random BIST Technique.
IOLTW 2002: 140- |
| 3 | EE | Nadir Z. Basturkmen,
Sudhakar M. Reddy,
Irith Pomeranz:
Pseudo Random Patterns Using Markov Sources for Scan BIST.
ITC 2002: 1013-1021 |
| 2 | EE | Nadir Z. Basturkmen,
Sudhakar M. Reddy,
Janusz Rajski:
Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST.
VLSI Design 2002: 604- |
| 1999 |
|---|
| 1 | EE | Sudhakar M. Reddy,
Irith Pomeranz,
Nadir Z. Basturkmen,
Xijiang Lin:
Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential Circuits.
VTS 1999: 275-283 |
