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Vincenzo Tancorre

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2006
7EEDavide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171
2004
6EEDavide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre: Yield Analysis of Logic Circuits. VTS 2004: 103-108
5EEDavide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew: Understanding Yield Losses in Logic Circuits. IEEE Design & Test of Computers 21(3): 208-215 (2004)
4EEDavide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electronic Testing 20(1): 79-87 (2004)
2003
3EEDavide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante: Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385
2002
2EEDavide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW 2002: 206-210
1EEDavide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT 2002: 12-16

Coauthor Index

1Davide Appello [1] [2] [3] [4] [5] [6] [7]
2Paolo Bernardi [3] [4] [7]
3Fulvio Corno [1] [2] [4]
4Alessandra Fudoli [1] [2] [3] [4] [5] [6]
5Katia Giarda [5] [6]
6Emil Gizdarski [5] [6]
7Michelangelo Grosso [7]
8Ben Mathew [5] [6]
9Maurizio Rebaudengo [1] [2] [3] [4] [7]
10Matteo Sonza Reorda [1] [2] [3] [4] [7]
11Massimo Violante [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)