| 2006 |
|---|
| 7 | EE | Davide Appello,
Vincenzo Tancorre,
Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
On the Automation of the Test Flow of Complex SoCs.
VTS 2006: 166-171 |
| 2004 |
|---|
| 6 | EE | Davide Appello,
Alessandra Fudoli,
Katia Giarda,
Emil Gizdarski,
Ben Mathew,
Vincenzo Tancorre:
Yield Analysis of Logic Circuits.
VTS 2004: 103-108 |
| 5 | EE | Davide Appello,
Alessandra Fudoli,
Katia Giarda,
Vincenzo Tancorre,
Emil Gizdarski,
Ben Mathew:
Understanding Yield Losses in Logic Circuits.
IEEE Design & Test of Computers 21(3): 208-215 (2004) |
| 4 | EE | Davide Appello,
Alessandra Fudoli,
Vincenzo Tancorre,
Paolo Bernardi,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
J. Electronic Testing 20(1): 79-87 (2004) |
| 2003 |
|---|
| 3 | EE | Davide Appello,
Paolo Bernardi,
Alessandra Fudoli,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Vincenzo Tancorre,
Massimo Violante:
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.
ITC 2003: 379-385 |
| 2002 |
|---|
| 2 | EE | Davide Appello,
Alessandra Fudoli,
Vincenzo Tancorre,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
IOLTW 2002: 206-210 |
| 1 | EE | Davide Appello,
Alessandra Fudoli,
Vincenzo Tancorre,
Fulvio Corno,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
MTDT 2002: 12-16 |
