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2002 | ||
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3 | EE | Adam Kristof: On-Line Detection of Short Circuits in Digital Devices and Systems. IOLTW 2002: 183 |
2 | EE | Adam Kristof: Improved Digital I/O Ports Enhance Testability of Interconnections. ITC 2002: 763-772 |
1997 | ||
1 | EE | Adam Kristof: Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections. ED&TC 1997: 630 |