2004 |
8 | EE | Daniel Barros Jr.,
Fabian Vargas,
Marcelino B. Santos,
Isabel C. Teixeira,
João Paulo Teixeira:
Modeling and Simulation of Time Domain Faults in Digital Systems.
IOLTS 2004: 5-10 |
7 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.,
Diogo B. Brum,
Eduardo Luis Rhod:
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems.
J. Electronic Testing 20(4): 397-411 (2004) |
2003 |
6 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.,
Diogo B. Brum:
Briefing a New Approach to Improve the EMI Immunity of DSP Systems.
Asian Test Symposium 2003: 468-473 |
5 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems.
J. Electronic Testing 19(1): 61-72 (2003) |
2002 |
4 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.:
Experimental Results of a Recovery Block Scheme to Handle Noise in Speech Recognition Systems.
Asian Test Symposium 2002: 224-229 |
3 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems.
IOLTW 2002: 187 |
2001 |
2 | EE | Fabian Vargas,
Rubem Dutra Ribeiro Fagundes,
Daniel Barros Jr.:
A New Approach to Design Reliable Real-Time Speech Recognition Systems.
IOLTW 2001: 187-191 |
1998 |
1 | EE | Fabian Vargas,
E. Bezerra,
L. Wulff,
Daniel Barros Jr.:
Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems.
Asian Test Symposium 1998: 52-57 |