| 2005 |
|---|
| 9 | EE | B. Alorda,
Sebastià A. Bota,
Jaume Segura:
A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits.
IOLTS 2005: 177-182 |
| 2004 |
|---|
| 8 | EE | B. Alorda,
Vicens Canals,
Ivan de Paúl,
Jaume Segura:
A BIST-based Charge Analysis for Embedded Memories.
IOLTS 2004: 199-206 |
| 7 | EE | B. Alorda,
Vincent Canals,
Jaume Segura:
A Two-Level Power-Grid Model for Transient Current Testing Evaluation.
J. Electronic Testing 20(5): 543-552 (2004) |
| 2003 |
|---|
| 6 | EE | B. Alorda,
Jaume Segura:
An Evaluation of Built-in vs. Off-chip Strategies for On-line Transient Current Testing.
IOLTS 2003: 178-182 |
| 5 | EE | B. Alorda,
B. Bloechel,
Ali Keshavarzi,
Jaume Segura:
CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing.
ITC 2003: 719-726 |
| 2002 |
|---|
| 4 | EE | B. Alorda,
André Ivanov,
Jaume Segura:
An Off-Chip Sensor Circuit for On-Line Transient Current Testing.
IOLTW 2002: 192 |
| 3 | EE | B. Alorda,
M. Rosales,
Jerry M. Soden,
Charles F. Hawkins,
Jaume Segura:
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs.
ITC 2002: 947-953 |
| 2001 |
|---|
| 2 | EE | Ivan de Paúl,
M. Rosales,
B. Alorda,
Jaume Segura,
Charles F. Hawkins,
Jerry M. Soden:
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments.
VTS 2001: 286-291 |
| 2000 |
|---|
| 1 | EE | B. Alorda,
Ivan de Paúl,
Jaume Segura,
T. Miller:
On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor.
IOLTW 2000: 87-91 |
