2009 |
14 | EE | Eugeni García-Moreno,
Kay Suenaga,
Rodrigo Picos,
Sebastià A. Bota,
Miquel Roca,
Eugeni Isern:
Predictive test strategy for CMOS RF mixers.
Integration 42(1): 95-102 (2009) |
2007 |
13 | EE | Kay Suenaga,
Rodrigo Picos,
Sebastià A. Bota,
Miquel Roca,
Eugeni Isern,
Eugenio García:
A Module for BiST of CMOS RF Receivers.
J. Electronic Testing 23(6): 605-612 (2007) |
2004 |
12 | EE | Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Sebstatià A. Bota,
Eugenio García:
On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
IOLTS 2004: 179 |
2003 |
11 | EE | Rodrigo Picos,
Joan Font,
Eugeni Isern,
Miquel Roca,
Eugenio García:
A Configurable Built in Current Sensor for Mixed Signal Circuit Testing.
IOLTS 2003: 167 |
10 | EE | Eugeni Isern,
Miquel Roca,
Francesc Moll:
Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits.
PATMOS 2003: 481-490 |
9 | EE | Joan Font,
J. Ginard,
Rodrigo Picos,
Eugeni Isern,
Jaume Segura,
Miquel Roca,
Eugenio García:
A BICS for CMOS OpAmps by Monitoring the Supply Current Peak.
J. Electronic Testing 19(5): 597-603 (2003) |
8 | EE | Joan Font,
Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Eugeni García-Moreno:
A new BICS for CMOS operational amplifiers by using oscillation test techniques.
Microelectronics Journal 34(10): 919-926 (2003) |
7 | EE | Francesc Moll,
Miquel Roca,
Eugeni Isern:
Analysis of dissipation energy of switching digital CMOS gates with coupled outputs.
Microelectronics Journal 34(9): 833-842 (2003) |
2002 |
6 | EE | Joan Font,
J. Ginard,
Eugeni Isern,
Miquel Roca,
Jaume Segura,
Eugenio García:
A BICS for CMOS Opamps by Monitoring the Supply Current Peak.
IOLTW 2002: 94-98 |
2000 |
5 | EE | J. A. Sainz,
R. Muñoz,
J. A. Maiz,
L. A. Aguado,
Miquel Roca:
A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits.
IOLTW 2000: 45-51 |
4 | EE | Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Jaume Segura,
Eugeni García-Moreno:
Experimental Results on BIC Sensors for Transient Current Testing.
J. Electronic Testing 16(3): 235-241 (2000) |
1999 |
3 | EE | Eugeni Isern,
Miquel Roca,
Jaume Segura:
Analyzing the Need for ATPG Targeting GOS Defects.
VTS 1999: 420-425 |
1998 |
2 | EE | Eugenio García Moreno,
Benjamín Iñíguez,
Miquel Roca,
Jaume Segura,
Eugeni Isern:
Clocked Dosimeter Compatible with Digital CMOS Technology.
J. Electronic Testing 12(1-2): 101-110 (1998) |
1995 |
1 | EE | Miquel Roca,
Antonio Rubio:
Current testability analysis of feedback bridging faults in CMOS circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(10): 1299-1305 (1995) |