| 2008 |
|---|
| 3 | EE | Masato Nakasato,
Michiko Inoue,
Satoshi Ohtake,
Hideo Fujiwara:
Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors.
IEICE Transactions 91-D(3): 763-770 (2008) |
| 2007 |
|---|
| 2 | EE | Masato Nakasato,
Satoshi Ohtake,
Kewal K. Saluja,
Hideo Fujiwara:
Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability.
IEICE Transactions 90-D(1): 296-305 (2007) |
| 2006 |
|---|
| 1 | EE | Ilia Polian,
Bernd Becker,
Masato Nakasato,
Satoshi Ohtake,
Hideo Fujiwara:
Low-Cost Hardening of Image Processing Applications Against Soft Errors.
DFT 2006: 274-279 |
