Thomas Fiehn

2005
1	EE	Ilia Polian, Thomas Fiehn, Bernd Becker, John P. Hayes: A Family of Logical Fault Models for Reversible Circuits. Asian Test Symposium 2005: 422-427

Coauthor Index

1	Bernd Becker	[1]
2	John P. Hayes	[1]
3	Ilia Polian	[1]