| 2009 |
|---|
| 5 | EE | Alejandro Czutro,
Ilia Polian,
Matthew Lewis,
Piet Engelke,
Sudhakar M. Reddy,
Bernd Becker:
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.
VLSI Design 2009: 227-232 |
| 2007 |
|---|
| 4 | EE | Ilia Polian,
Alejandro Czutro,
Bernd Becker:
Evolutionary Optimization in Code-Based Test Compression
CoRR abs/0710.4670: (2007) |
| 3 | EE | Ilia Polian,
Alejandro Czutro,
Sandip Kundu,
Bernd Becker:
Power Droop Testing.
IEEE Design & Test of Computers 24(3): 276-284 (2007) |
| 2006 |
|---|
| 2 | EE | Ilia Polian,
Alejandro Czutro,
Sandip Kundu,
Bernd Becker:
Power Droop Testing.
ICCD 2006 |
| 2005 |
|---|
| 1 | EE | Ilia Polian,
Alejandro Czutro,
Bernd Becker:
Evolutionary Optimization in Code-Based Test Compression.
DATE 2005: 1124-1129 |
