| 2006 |
|---|
| 3 | EE | Yuyi Tang,
Hans-Joachim Wunderlich,
Piet Engelke,
Ilia Polian,
Bernd Becker,
Jürgen Schlöffel,
Friedrich Hapke,
Michael Wittke:
X-masking during logic BIST and its impact on defect coverage.
IEEE Trans. VLSI Syst. 14(2): 193-202 (2006) |
| 2004 |
|---|
| 2 | EE | Yuyi Tang,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Friedrich Hapke,
Michael Wittke,
Piet Engelke,
Ilia Polian,
Bernd Becker:
X-Masking During Logic BIST and Its Impact on Defect Coverage.
ITC 2004: 442-451 |
| 1 | EE | Valentin Gherman,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Friedrich Hapke,
Michael Wittke,
Michael Garbers:
Efficient Pattern Mapping for Deterministic Logic BIST.
ITC 2004: 48-56 |
