Harald P. E. Vranken

2008
18	EE	Herman Koppelman, Harald P. E. Vranken: Experiences with a synchronous virtual classroom in distance education. ITiCSE 2008: 194-198
2006
17	EE	Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke: Fault detection and diagnosis with parity trees for space compaction of test responses. DAC 2006: 1095-1098
2004
16	EE	Harald P. E. Vranken, Ferry Syafei Sapei, Hans-Joachim Wunderlich: Impact of Test Point Insertion on Silicon Area and Timing during Layout. DATE 2004: 810-815
15	EE	Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker: X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451
14	EE	Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers: Efficient Pattern Mapping for Deterministic Logic BIST. ITC 2004: 48-56
2003
13	EE	Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink: ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC 2003: 1069-1078
2002
12	EE	Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electronic Testing 18(2): 129-143 (2002)
2001
11	EE	A. Irion, Gundolf Kiefer, Harald P. E. Vranken, Hans-Joachim Wunderlich: Circuit partitioning for efficient logic BIST synthesis. DATE 2001: 86-91
10		Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced reduced pin-count test for full-scan design. ITC 2001: 738-747
9	EE	Gundolf Kiefer, Harald P. E. Vranken, Erik Jan Marinissen, Hans-Joachim Wunderlich: Application of Deterministic Logic BIST on Industrial Circuits. J. Electronic Testing 17(3-4): 351-362 (2001)
2000
8	EE	Harald P. E. Vranken, Tomás Garciá Garciá, Sjouke Mauw, Loe M. G. Feijs: IC Design Validation Using Message Sequence Charts. EUROMICRO 2000: 1122-
7	EE	Jeroen Voeten, Harald P. E. Vranken: Behavior-Preserving Transformations for Design-for-Test. EUROMICRO 2000: 1193-
6		Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P. E. Vranken, Erik Jan Marinissen: Application of deterministic logic BIST on industrial circuits. ITC 2000: 105-114
5	EE	Harald P. E. Vranken: Debug Facilities in the TriMedia CPU64 Architecture. J. Electronic Testing 16(3): 301-308 (2000)
1999
4	EE	Jos T. J. van Eijndhoven, Kees A. Vissers, Evert-Jan D. Pol, P. Struik, R. H. J. Bloks, Pieter van der Wolf, Harald P. E. Vranken, Frans Sijstermans, M. J. A. Tromp, Andy D. Pimentel: TriMedia CPU64 Architecture. ICCD 1999: 586-592
1997
3	EE	Harald P. E. Vranken, M. P. J. Stevens, M. T. M. Segers: Design-For-Debug in Hardware/Software Co-Design. CODES 1997: 35-42
1996
2	EE	Harald P. E. Vranken, Marc F. Witteman, Ronald C. van Wuijtswinkel: Design for Testability in Hardware-Software Systems. IEEE Design & Test of Computers 13(3): 79-87 (1996)
1994
1		Harald P. E. Vranken, M. P. J. Stevens, M. T. M. Segers, J. H. M. M. van Rhee: System-Level Testability of Hardware/Software Systems. ITC 1994: 134-142

Coauthor Index

1	Bernd Becker	[15]
2	R. H. J. Bloks	[4]
3	Domenico Chindamo	[13]
4	Jos T. J. van Eijndhoven	[4]
5	Piet Engelke	[15]
6	Loe M. G. Feijs	[8]
7	Hérvé Fleury	[10] [12]
8	Michael Garbers	[14]
9	Tomás Garciá Garciá	[8]
10	Valentin Gherman	[14]
11	Andreas Glowatz	[17]
12	Sandeep Kumar Goel	[17]
13	Friedrich Hapke	[13] [14] [15] [17]
14	A. Irion	[11]
15	Gundolf Kiefer	[6] [9] [11]
16	Herman Koppelman	[18]
17	David Lelouvier	[10] [12]
18	Erik Jan Marinissen	[6] [9]
19	Sjouke Mauw	[8]
20	Andy D. Pimentel	[4]
21	Evert-Jan D. Pol	[4]
22	Ilia Polian	[15]
23	J. H. M. M. van Rhee	[1]
24	Soenke Rogge	[13]
25	Ferry Syafei Sapei	[16]
26	Jürgen Schlöffel	[17]
27	M. T. M. Segers	[1] [3]
28	Frans Sijstermans	[4]
29	M. P. J. Stevens	[1] [3]
30	P. Struik	[4]
31	Yuyi Tang	[15]
32	M. J. A. Tromp	[4]
33	Kees A. Vissers	[4]
34	Jeroen Voeten	[7]
35	Erik H. Volkerink	[13]
36	Tom Waayers	[10] [12]
37	Marc F. Witteman	[2]
38	Michael Wittke	[14] [15]
39	Pieter van der Wolf	[4]
40	Ronald C. van Wuijtswinkel	[2]
41	Hans-Joachim Wunderlich	[6] [9] [11] [14] [15] [16]

Colors in the list of coauthors