| 2008 |
|---|
| 3 | EE | Ilia Polian,
Kohei Miyase,
Yusuke Nakamura,
Seiji Kajihara,
Piet Engelke,
Bernd Becker,
Stefan Spinner,
Xiaoqing Wen:
Diagnosis of Realistic Defects Based on the X-Fault Model.
DDECS 2008: 263-266 |
| 2 | EE | Stefan Spinner,
Ilia Polian,
Piet Engelke,
Bernd Becker,
Martin Keim,
Wu-Tung Cheng:
Automatic Test Pattern Generation for Interconnect Open Defects.
VTS 2008: 181-186 |
| 2007 |
|---|
| 1 | EE | Stefan Spinner,
J. Bartholomeyczik,
Bernd Becker,
M. Doelle,
O. Paul,
Ilia Polian,
R. Roth,
K. Seitz,
P. Ruther:
Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors
CoRR abs/0711.3289: (2007) |
