| |
| 2006 | ||
|---|---|---|
| 2 | EE | Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke: X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst. 14(2): 193-202 (2006) |
| 2004 | ||
| 1 | EE | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker: X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451 |
| 1 | Bernd Becker | [1] [2] |
| 2 | Piet Engelke | [1] [2] |
| 3 | Friedrich Hapke | [1] [2] |
| 4 | Ilia Polian | [1] [2] |
| 5 | Jürgen Schlöffel | [2] |
| 6 | Harald P. E. Vranken | [1] |
| 7 | Michael Wittke | [1] [2] |
| 8 | Hans-Joachim Wunderlich | [1] [2] |