| 2008 |
|---|
| 6 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Sandip Kundu,
Bharath Seshadri,
Bernd Becker:
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 327-338 (2008) |
| 2006 |
|---|
| 5 | EE | Bharath Seshadri,
Xiaoming Yu,
Srikanth Venkataraman:
Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification.
VTS 2006: 380-385 |
| 4 | EE | Bharath Seshadri,
Irith Pomeranz,
Srikanth Venkataraman,
Enamul Amyeen,
Sudhakar M. Reddy:
Dominance Based Analysis for Large Volume Production Fail Diagnosis.
VTS 2006: 392-399 |
| 2004 |
|---|
| 3 | EE | Irith Pomeranz,
Srikanth Venkataraman,
Sudhakar M. Reddy,
Bharath Seshadri:
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis.
DATE 2004: 68-75 |
| 2 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Bharath Seshadri,
Bernd Becker:
The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults.
VTS 2004: 171-178 |
| 2003 |
|---|
| 1 | EE | Srigurunath Chakravarthi,
C. R. Krishna Kumar,
Anthony Skjellum,
H. A. Prahalad,
Bharath Seshadri:
A Model for Performance Analysis of MPI Applications on Terascale Systems.
PVM/MPI 2003: 81-87 |
