dblp.uni-trier.dewww.uni-trier.de

Friedrich Hapke

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2008
9EERolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille: On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1329-1333 (2008)
2007
8EEStephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6
7EEStephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187
2006
6EEHarald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke: Fault detection and diagnosis with parity trees for space compaction of test responses. DAC 2006: 1095-1098
5EEYuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke: X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst. 14(2): 193-202 (2006)
2005
4EEJunhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217
2004
3EEYuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker: X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451
2EEValentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers: Efficient Pattern Mapping for Deterministic Logic BIST. ITC 2004: 48-56
2003
1EEHarald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink: ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC 2003: 1069-1078

Coauthor Index

1Bernd Becker [3] [5]
2Domenico Chindamo [1]
3Rolf Drechsler [4] [7] [8] [9]
4Stephan Eggersglüß [7] [8] [9]
5Piet Engelke [3] [5]
6Görschwin Fey [4] [7] [8] [9]
7Michael Garbers [2]
8Valentin Gherman [2]
9Andreas Glowatz [4] [6] [7] [8] [9]
10Sandeep Kumar Goel [6]
11Ilia Polian [3] [5]
12Soenke Rogge [1]
13Jürgen Schlöffel [4] [5] [6] [7] [8] [9]
14Junhao Shi [4]
15Yuyi Tang [3] [5]
16Daniel Tille [8] [9]
17Erik H. Volkerink [1]
18Harald P. E. Vranken [1] [2] [3] [6]
19Michael Wittke [2] [3] [5]
20Hans-Joachim Wunderlich [2] [3] [5]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)