| 2005 |
|---|
| 5 | EE | Ilia Polian,
Sandip Kundu,
Jean Marc Gallière,
Piet Engelke,
Michel Renovell,
Bernd Becker:
Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
VTS 2005: 343-348 |
| 4 | EE | Jean Marc Gallière,
Michel Renovell,
Florence Azaïs,
Yves Bertrand:
Delay Testing Viability of Gate Oxide Short Defects.
J. Comput. Sci. Technol. 20(2): 195-200 (2005) |
| 2003 |
|---|
| 3 | EE | Michel Renovell,
Jean Marc Gallière,
Florence Azaïs,
Yves Bertrand:
Delay Testing of MOS Transistor with Gate Oxide Short.
Asian Test Symposium 2003: 168-173 |
| 2 | EE | Michel Renovell,
Jean Marc Gallière,
Florence Azaïs,
Yves Bertrand:
Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short.
J. Electronic Testing 19(4): 377-386 (2003) |
| 2001 |
|---|
| 1 | | Michel Renovell,
Jean Marc Gallière,
Florence Azaïs,
Serge Bernard,
Yves Bertrand:
Boolean and current detection of MOS transistor with gate oxide short.
ITC 2001: 1039-1048 |
