ITC 1984:
Philadelphia, PA, USA
Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984.
IEEE Computer Society 1984 BibTeX
Session 1: Test Economics
Session 2: Update on Automatic Test Pattern Generation
- Joseph L. A. Hughes, Edward J. McCluskey:
An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets.
52-58 BibTeX
- J. Paul Roth, Vojin G. Oklobdzija, John F. Beetem:
Test Generation for FET Switching Circuits.
59-62 BibTeX
- Brian J. Heard, Ramu N. Sheshadri, Ronald B. David, Arvid G. Sammuli:
Automatic Test Pattern Generation for Asynchronous Networks.
63-69 BibTeX
- Harry H. Chen, Robert G. Mathews, John A. Newkirk:
Test Generation for MOS Circuits.
70-79 BibTeX
- Erwin Trischler:
ATWIG, An Automatic Test Pattern Generator with Inherent Guidance.
80-87 BibTeX
- Tohru Sasaki, Shunichi Kato, Nobuyoshi Nomizu, Hidetoshi Tanaka:
Logic Design Verification Using Automated Test Generation.
88-95 BibTeX
Session 3: New Developments in Test System Accuracy
Session 4: Built-In Self Test Design and Analysis Techniques
Panel Session 5: Implications of Hardware Design Language
Session 6: Artificial Intelligence in VLSI Test Systems
Session 7: Printed Circult Board Manufacturing Process and Test Data Management
Session 8: Recent Developments in Computer Alded Testing
Session 9: Memory Test
Session 10: Stimulus Generation and Application for Built-In-Self Test
Session 11: Intergrated Circult Manufacturing Process and Test Data Management
Session 12: Physical Tralt Measurement on Components
Session 13: Analog and Hybrid Testing
Session 14: New Directions for VLSI Test Systems
Session 15: Systems Test
Session 16: How, Where, Why, and When of Lsi Burn-In
Session 17: Advanced Probing Techniques for VLSI Devices
- Francois J. Henley:
An Automated Laser Prober to Determine VLSI Internal Node Logic States.
536-542 BibTeX
- Y. Goto, K. Ozaki, T. Ishizuka, A. Ito, Y. Furukawa, T. Inagaki:
Electron Beam Prober for LSI Testing with 100ps Time Resolution.
543-549 BibTeX
- P. Küollensperger, A. Krupp, M. Sturm, R. Weyl, F. Widulla, F. Wolfgang:
Automated Electron Beam Testing of VLSI Circuits.
550-557 BibTeX
Session 18: Advances In Board Test Techniques
Session 19: Software For Successful Test Systems
Session 20: VLSI Microprocessor Testing I
Session 21: Testability Analysis
Session 22: Test Program Generation Tools
Session 24: VLSI Microprocessor Testing II
Session 25: Design for Testability
Copyright © Sat May 16 23:26:40 2009
by Michael Ley (ley@uni-trier.de)
