Laung-Terng Wang

2008
23	EE	Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael Hsiao, James Chien-Mo Li, Jiun Lang Huang, Ravi Apte: On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151
22	EE	Laung-Terng Wang, Charles E. Stroud, Kwang-Ting (Tim) Cheng: Logic Testing. Wiley Encyclopedia of Computer Science and Engineering 2008
21	EE	Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu: VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Design & Test of Computers 25(2): 122-130 (2008)
20	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. J. Electronic Testing 24(4): 379-391 (2008)
2007
19	EE	B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores CoRR abs/0710.4645: (2007)
18	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions 90-D(9): 1398-1405 (2007)
2006
17	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006
16	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita: A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006: 58-65
15	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006)
14	EE	Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: A New Method for Low-Capture-Power Test Generation for Scan Testing. IEICE Transactions 89-D(5): 1679-1686 (2006)
2005
13	EE	B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores. DATE 2005: 860-861
12	EE	Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo: At-Speed Logic BIST Architecture for Multi-Clock Designs. ICCD 2005: 475-478
11	EE	Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On Low-Capture-Power Test Generation for Scan Testing. VTS 2005: 265-270
10	EE	Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja: Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics 1(3): 319-330 (2005)
2004
9	EE	Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On per-test fault diagnosis using the X-fault model. ICCAD 2004: 633-640
8	EE	Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai: VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. ITC 2004: 916-925
1988
7		Laung-Terng Wang, Edward J. McCluskey: Linear Feedback Shift Register Design Using Cyclic Codes. IEEE Trans. Computers 37(10): 1302-1306 (1988)
6	EE	Laung-Terng Wang, Edward J. McCluskey: Hybrid designs generating maximum-length sequences. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 91-99 (1988)
5	EE	Laung-Terng Wang, Edward J. McCluskey: Circuits for pseudoexhaustive test pattern generation. IEEE Trans. on CAD of Integrated Circuits and Systems 7(10): 1068-1080 (1988)
1986
4		Laung-Terng Wang, Edward J. McCluskey: Circuits for Pseudo-Exhaustive Test Pattern Generation. ITC 1986: 25-37
3		Laung-Terng Wang, Edward J. McCluskey: A Hybrid Design of Maximum-Length Sequence Generators. ITC 1986: 38-47
2		Laung-Terng Wang, Edward J. McCluskey: Condensed Linear Feedback Shift Register (LFSR) Testing - A Pseudoexhaustive Test Technique. IEEE Trans. Computers 35(4): 367-370 (1986)
1984
1		Zuhi Sun, Laung-Terng Wang: Self-Testing of Embedded RAMs. ITC 1984: 148-156

Coauthor Index

1	Khader S. Abdel-Hafez	[8] [16]
2	Ravi Apte	[23]
3	H. Chao	[13] [19]
4	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[22]
5	B. Cheon	[13] [19]
6	J. Cho	[13] [19]
7	Hiroshi Furukawa	[8]
8	Xinli Gu	[21]
9	Jonhson Guo	[12]
10	Michael Hsiao	[23]
11	Fei-Sheng Hsu	[8]
12	P. Hsu	[13] [19]
13	Po-Ching Hsu	[12]
14	Jiun Lang Huang	[23]
15	Zhigang Jiang	[21] [23]
16	Seiji Kajihara	[9] [10] [11] [14] [15] [16] [17] [18] [20]
17	Kozo Kinoshita	[9] [11] [14] [15] [16] [18] [20]
18	E. Lee	[13] [19]
19	Chien-Mo James Li (James Chien-Mo Li)	[23]
20	Shyh-Horng Lin	[8]
21	Edward J. McCluskey	[2] [3] [4] [5] [6] [7]
22	Yoshihiro Minamoto	[10]
23	Kohei Miyase	[10] [15] [16] [17] [18] [20]
24	Tokiharu Miyoshi	[9]
25	J. Park	[13] [19]
26	Kewal K. Saluja	[9] [10] [11] [14] [15] [16] [17] [18] [20]
27	Boryau Sheu	[21] [23]
28	Jiayong Song	[23]
29	Charles E. Stroud	[22]
30	Zuhi Sun	[1]
31	Tatsuya Suzuki	[10] [16] [17] [18] [20]
32	Sen-Wei Tsai	[8]
33	Zhigang Wang	[21]
34	Xiaoqing Wen	[8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [23]
35	Shianling Wu	[8] [12] [13] [19] [21] [23]
36	Yoshiyuki Yamashita	[11] [14]
37	Yuta Yamato	[15] [17]

Colors in the list of coauthors