Harry H. Chen

1985
2		Harry H. Chen, Robert G. Mathews, John A. Newkirk: An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312
1984
1		Harry H. Chen, Robert G. Mathews, John A. Newkirk: Test Generation for MOS Circuits. ITC 1984: 70-79

Coauthor Index

1	Robert G. Mathews	[1] [2]
2	John A. Newkirk	[1] [2]