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Harry H. Chen

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1985
2 Harry H. Chen, Robert G. Mathews, John A. Newkirk: An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312
1984
1 Harry H. Chen, Robert G. Mathews, John A. Newkirk: Test Generation for MOS Circuits. ITC 1984: 70-79

Coauthor Index

1Robert G. Mathews [1] [2]
2John A. Newkirk [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)