1985 | ||
---|---|---|
2 | Harry H. Chen, Robert G. Mathews, John A. Newkirk: An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312 | |
1984 | ||
1 | Harry H. Chen, Robert G. Mathews, John A. Newkirk: Test Generation for MOS Circuits. ITC 1984: 70-79 |
1 | Robert G. Mathews | [1] [2] |
2 | John A. Newkirk | [1] [2] |