| 1988 |
|---|
| 5 | | Francois J. Henley,
Hee-June Choi:
Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics for a Gigahertz Production Test System.
ITC 1988: 700-709 |
| 4 | | Dean J. Kratzer,
Steve Barton,
Francois J. Henley,
David A. Plomgrem:
High-Speed Pattern Generator and GaAs Pin : Electronics for a Gigahertz Production Test System.
ITC 1988: 710-718 |
| 1986 |
|---|
| 3 | | Francois J. Henley:
Tests of Hermetically Sealed LSI/VLSI Devices by Laser Photoexcitation Logic Analysis.
ITC 1986: 607-611 |
| 1985 |
|---|
| 2 | | Uming Ko,
Dinesh G. Patel,
Francois J. Henley:
Contactless VLSI Laser Probing.
ITC 1985: 930-937 |
| 1984 |
|---|
| 1 | | Francois J. Henley:
An Automated Laser Prober to Determine VLSI Internal Node Logic States.
ITC 1984: 536-542 |
