| 1986 |
|---|
| 4 | | T. Noguchi,
Atsushi Murakami,
Masato Kawai,
Y. Hayasaka:
Testing for a Solid-State Color Image Sensor.
ITC 1986: 683-687 |
| 3 | | Y. Nishimura,
M. Hamada,
H. Hidaka,
H. Ozaki,
K. Fujishima,
Y. Hayasaka:
Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode.
ITC 1986: 826-829 |
| 1984 |
|---|
| 2 | | Y. Nishimura,
M. Hamada,
Y. Hayasaka:
A New Timing Calibration Method for High Speed Memory Test.
ITC 1984: 113-117 |
| 1982 |
|---|
| 1 | | Y. Hayasaka,
K. Shimotori,
K. Okada:
Testing System for Redundant Memory.
ITC 1982: 240-244 |
