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1999 | ||
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2 | EE | Ying Xu, Eduard Cerny, Allan Silburt, A. Coady, Ying Liu, Philip Pownall: Practical Application of Formal Verification Techniques on a Frame Mux/Demux Chip from Nortel Semiconductors. CHARME 1999: 110-124 |
1984 | ||
1 | Franc Brglez, Philip Pownall, Robert Hum: Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. ITC 1984: 705-712 |
1 | Franc Brglez | [1] |
2 | Eduard Cerny | [2] |
3 | A. Coady | [2] |
4 | Robert Hum | [1] |
5 | Ying Liu | [2] |
6 | Allan Silburt | [2] |
7 | Ying Xu | [2] |