Charles R. Kime

1997
28		Danial J. Neebel, Charles R. Kime: Cellular Automata for Weighted Random Pattern Generation. IEEE Trans. Computers 46(11): 1219-1229 (1997)
1996
27		Mohammed F. AlShaibi, Charles R. Kime: MFBIST: A BIST Method for Random Pattern Resistant Circuits. ITC 1996: 176-185
1995
26	EE	Kee Sup Kim, Charles R. Kime: Partial scan flip-flop selection by use of empirical testability. J. Electronic Testing 7(1-2): 47-59 (1995)
1994
25		Mohammed F. AlShaibi, Charles R. Kime: Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. ITC 1994: 929-938
1993
24		Danial J. Neebel, Charles R. Kime: Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. ITC 1993: 1013-1022
23		Kee Sup Kim, Charles R. Kime: Partial Scan Using Reverse Direction Empirical Testability. ITC 1993: 498-506
22	EE	Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja: A Tutorial on Built-in Self-Test. I. Principles. IEEE Design & Test of Computers 10(1): 73-82 (1993)
21	EE	Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja: A Tutorial on Built-In Self-Test, Part 2: Applications. IEEE Design & Test of Computers 10(2): 69-77 (1993)
20	EE	Byung S. So, Charles R. Kime: A fault simulation method: Parallel pattern critical path tracing. J. Electronic Testing 4(3): 255-265 (1993)
1992
19		John Y. Sayah, Charles R. Kime: Test Scheduling in High Performance VLSI System Implementations. IEEE Trans. Computers 41(1): 52-67 (1992)
1990
18		Kee Sup Kim, Charles R. Kime: Partial Scan by Use of Empirical Testability. ICCAD 1990: 314-317
1988
17		Charles R. Kime: Impact of Testability Standards on University Research and Instruction. ITC 1988: 199-200
16		John Y. Sayah, Charles R. Kime: : Test Scheduling for High Performance VLSI System Implementations. ITC 1988: 421-430
15		Leon J. Sigal, Charles R. Kime: Concurrent Off-Phase Built-in Self-Test of Dormant Logic. ITC 1988: 934-941
14		Gary L. Craig, Charles R. Kime, Kewal K. Saluja: Test Scheduling and Control for VLSI Built-In Self-Test. IEEE Trans. Computers 37(9): 1099-1109 (1988)
13	EE	Kewal K. Saluja, Rajiv Sharma, Charles R. Kime: A concurrent testing technique for digital circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 7(12): 1250-1260 (1988)
1985
12		Gary L. Craig, Charles R. Kime: Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. ITC 1985: 126-139
1984
11		Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams: A Built-In Test Methodology for VLSI Data Paths. ITC 1984: 327-337
10		John A. McPherson, Charles R. Kime: Diagnosis in the Presence of Known Faults. IEEE Trans. Computers 33(10): 943-947 (1984)
1982
9		Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith: WISPAC: A Parallel Array Computer for Simulation Applications. IMACS World Congress 1982: 159-169
1979
8		John A. McPherson, Charles R. Kime: A Two-Level Diagnostic Model for Digital Systems. IEEE Trans. Computers 28(1): 16-27 (1979)
7		Charles R. Kime: An Abstract Model for Digital System Fault Diagnosis. IEEE Trans. Computers 28(10): 754-767 (1979)
1976
6		Ramachendra P. Batni, Charles R. Kime: A Module-Level Testing Approach for Combinational Networks. IEEE Trans. Computers 25(6): 594-604 (1976)
1975
5		Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell: Comments on ``Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences. IEEE Trans. Computers 24(1): 108 (1975)
4		Jeffrey D. Russell, Charles R. Kime: System Fault Diagnosis: Closure and Diagnosability with Repair. IEEE Trans. Computers 24(11): 1078-1089 (1975)
3		Jeffrey D. Russell, Charles R. Kime: System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. IEEE Trans. Computers 24(12): 1155-1161 (1975)
2		Charles R. Kime: Fault Tolerant Computing: An Introduction and a Perspective. IEEE Trans. Computers 24(5): 457-460 (1975)
1974
1	EE	Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime: An Efficient Algorithm for Finding an Irredundant Set Cover. J. ACM 21(3): 351-355 (1974)

Coauthor Index

1	Vishwani D. Agrawal	[21] [22]
2	Mohammed F. AlShaibi	[25] [27]
3	Ramachendra P. Batni	[1] [6]
4	Gary L. Craig	[12] [14]
5	J. Eastman	[9]
6	Adel Said Elmaghraby	[9]
7	Raphael A. Finkel	[9]
8	A. A. Frank	[9]
9	T. J. Kaminsky	[9]
10	Kee Sup Kim	[18] [23] [26]
11	H. H. Kwan	[11]
12	J. K. Lemke	[11]
13	John A. McPherson	[8] [9] [10]
14	Gernot Metze	[5]
15	Danial J. Neebel	[24] [28]
16	Michael Jon Redmond	[9]
17	Vincent C. Rideout	[9]
18	Jeffrey D. Russell	[1] [3] [4] [5]
19	Kewal K. Saluja	[13] [14] [21] [22]
20	John Y. Sayah	[16] [19]
21	Donald R. Schertz	[5]
22	Rajiv Sharma	[13]
23	Leon J. Sigal	[15]
24	S. Diane Smith	[9]
25	Byung S. So	[20]
26	Kilin To	[5]
27	Gordon Whitney	[5]
28	Gerald B. Williams	[11]

Colors in the list of coauthors