Eric Sacher

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1984

2 Eric Sacher: Component Level Fault-Isolation Techniques in a Systems Test Environment. ITC 1984: 489-492

1981

1 Eric Sacher: High-Speed Functional Testing of Microprocessor-Based Circuit Boards. ITC 1981: 249-252

1984
2		Eric Sacher: Component Level Fault-Isolation Techniques in a Systems Test Environment. ITC 1984: 489-492
1981
1		Eric Sacher: High-Speed Functional Testing of Microprocessor-Based Circuit Boards. ITC 1981: 249-252