E. F. Chace
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1984
1
Sushil K. Malik
, E. F. Chace: MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping.
ITC 1984
: 384-389
Coauthor
Index
1
Sushil K. Malik
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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