| 1995 |
|---|
| 8 | EE | Konstantin Keutner,
Erwin Trischler:
Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits.
J. Electronic Testing 6(1): 45-58 (1995) |
| 1994 |
|---|
| 7 | | Erwin Trischler,
Mats Johansson:
Ten: A Concurrent Test Engineering Environment.
IEEE Design & Test of Computers 11(3): 6-16 (1994) |
| 6 | EE | J. H. Dick,
Erwin Trischler,
Chryssa Dislis,
Anthony P. Ambler:
Sensitivity analysis in economics based test strategy planning.
J. Electronic Testing 5(2-3): 239-251 (1994) |
| 1992 |
|---|
| 5 | EE | Thomas M. Sarfert,
Remo G. Markgraf,
Michael H. Schulz,
Erwin Trischler:
A hierarchical test pattern generation system based on high-level primitives.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 34-44 (1992) |
| 1989 |
|---|
| 4 | | Thomas M. Sarfert,
Remo G. Markgraf,
Erwin Trischler,
Michael H. Schulz:
Hierarchical Test Pattern Generation Based on High-Level Primitives.
ITC 1989: 470-479 |
| 1988 |
|---|
| 3 | EE | Michael H. Schulz,
Erwin Trischler,
Thomas M. Sarfert:
SOCRATES: a highly efficient automatic test pattern generation system.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 126-137 (1988) |
| 1985 |
|---|
| 2 | | Erwin Trischler:
Guided Inconsistent Path Sensitization: Method And Experimental Results.
ITC 1985: 79-87 |
| 1984 |
|---|
| 1 | | Erwin Trischler:
ATWIG, An Automatic Test Pattern Generator with Inherent Guidance.
ITC 1984: 80-87 |
