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Erwin Trischler

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1995
8EEKonstantin Keutner, Erwin Trischler: Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits. J. Electronic Testing 6(1): 45-58 (1995)
1994
7 Erwin Trischler, Mats Johansson: Ten: A Concurrent Test Engineering Environment. IEEE Design & Test of Computers 11(3): 6-16 (1994)
6EEJ. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler: Sensitivity analysis in economics based test strategy planning. J. Electronic Testing 5(2-3): 239-251 (1994)
1992
5EEThomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler: A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 34-44 (1992)
1989
4 Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz: Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989: 470-479
1988
3EEMichael H. Schulz, Erwin Trischler, Thomas M. Sarfert: SOCRATES: a highly efficient automatic test pattern generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 126-137 (1988)
1985
2 Erwin Trischler: Guided Inconsistent Path Sensitization: Method And Experimental Results. ITC 1985: 79-87
1984
1 Erwin Trischler: ATWIG, An Automatic Test Pattern Generator with Inherent Guidance. ITC 1984: 80-87

Coauthor Index

1Anthony P. Ambler [6]
2J. H. Dick [6]
3Chryssa Dislis [6]
4Mats Johansson [7]
5Konstantin Keutner [8]
6Remo G. Markgraf [4] [5]
7Thomas M. Sarfert [3] [4] [5]
8Michael H. Schulz [3] [4] [5]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)