| |
| 1984 | ||
|---|---|---|
| 2 | Sushil K. Malik, E. F. Chace: MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping. ITC 1984: 384-389 | |
| 1983 | ||
| 1 | Sushil K. Malik, Jeffrey E. Gunn, Robert E. Camenga: Future of Temperature and Humidity Testing: Highly Accelerated Temperature and Humidity Stress Test (HAST). ITC 1983: 790-795 | |
| 1 | Robert E. Camenga | [1] |
| 2 | E. F. Chace | [2] |
| 3 | Jeffrey E. Gunn | [1] |