2004 |
8 | EE | Gordon D. Robinson:
Open Architecture ATE: Dream or Reality?.
ITC 2004: 1408 |
2002 |
7 | EE | Gordon D. Robinson:
Board Test: Wanted Dead or Alive.
ITC 2002: 1236 |
1999 |
6 | | Gordon D. Robinson:
DFT, test lifecycles and the product lifecycle.
ITC 1999: 705-713 |
1994 |
5 | | Gordon D. Robinson:
NAND Trees Accurately Diagnose Board-Level Pin Faults.
ITC 1994: 811-816 |
1992 |
4 | | Gordon D. Robinson:
Design and Test - The Next Problems.
ICCD 1992: 10 |
1991 |
3 | EE | Matthew L. Fichtenbaum,
Gordon D. Robinson:
Scan test architectures for digital board testers.
J. Electronic Testing 2(1): 99-105 (1991) |
1984 |
2 | | Gordon D. Robinson:
Artificial Intelligence and Testing.
ITC 1984: 200-205 |
1983 |
1 | | Gordon D. Robinson:
HITEST : Intelligent Test Generation.
ITC 1983: 311-323 |