| 2004 |
|---|
| 8 | EE | Gordon D. Robinson:
Open Architecture ATE: Dream or Reality?.
ITC 2004: 1408 |
| 2002 |
|---|
| 7 | EE | Gordon D. Robinson:
Board Test: Wanted Dead or Alive.
ITC 2002: 1236 |
| 1999 |
|---|
| 6 | | Gordon D. Robinson:
DFT, test lifecycles and the product lifecycle.
ITC 1999: 705-713 |
| 1994 |
|---|
| 5 | | Gordon D. Robinson:
NAND Trees Accurately Diagnose Board-Level Pin Faults.
ITC 1994: 811-816 |
| 1992 |
|---|
| 4 | | Gordon D. Robinson:
Design and Test - The Next Problems.
ICCD 1992: 10 |
| 1991 |
|---|
| 3 | EE | Matthew L. Fichtenbaum,
Gordon D. Robinson:
Scan test architectures for digital board testers.
J. Electronic Testing 2(1): 99-105 (1991) |
| 1984 |
|---|
| 2 | | Gordon D. Robinson:
Artificial Intelligence and Testing.
ITC 1984: 200-205 |
| 1983 |
|---|
| 1 | | Gordon D. Robinson:
HITEST : Intelligent Test Generation.
ITC 1983: 311-323 |
