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Gordon D. Robinson

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2004
8EEGordon D. Robinson: Open Architecture ATE: Dream or Reality?. ITC 2004: 1408
2002
7EEGordon D. Robinson: Board Test: Wanted Dead or Alive. ITC 2002: 1236
1999
6 Gordon D. Robinson: DFT, test lifecycles and the product lifecycle. ITC 1999: 705-713
1994
5 Gordon D. Robinson: NAND Trees Accurately Diagnose Board-Level Pin Faults. ITC 1994: 811-816
1992
4 Gordon D. Robinson: Design and Test - The Next Problems. ICCD 1992: 10
1991
3EEMatthew L. Fichtenbaum, Gordon D. Robinson: Scan test architectures for digital board testers. J. Electronic Testing 2(1): 99-105 (1991)
1984
2 Gordon D. Robinson: Artificial Intelligence and Testing. ITC 1984: 200-205
1983
1 Gordon D. Robinson: HITEST : Intelligent Test Generation. ITC 1983: 311-323

Coauthor Index

1Matthew L. Fichtenbaum [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)