Eugene R. Hnatek

1997
9	EE	Donald Staab, Eugene R. Hnatek: Diagnosing IC Failures in a Fast Environment. IEEE Design & Test of Computers 14(3): 70-75 (1997)
1995
8		Alex M. Ijaz, Eugene R. Hnatek: User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters. ITC 1995: 233-241
1993
7		Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz: Application of Statistical Techniques to Critical System Parameters. ITC 1993: 108-114
1989
6		Eugene R. Hnatek, Billy R. Livesay: Quality Issues of High Pin Count Fine Pitch VLSI Packages. ITC 1989: 397-422
1986
5		Eugene R. Hnatek: IC Burn-In : The Changing Scene. ITC 1986: 228-231
1984
4		Eugene R. Hnatek: Thoughts on VLSI Burn-in. ITC 1984: 531-535
3		Beau R. Wilson Jr., Eugene R. Hnatek: Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC 1984: 778-788
1982
2		Eugene R. Hnatek, Beau R. Wilson Jr.: An Evaluation of the 2816 EEPROM. ITC 1982: 225-235
1981
1		Eugene R. Hnatek: Documentation for Testability : The Supplier's Responsibility to the User. ITC 1981: 370-372

Coauthor Index

1	Rick Boyle	[7]
2	Jack Donovan	[7]
3	Alex M. Ijaz	[7] [8]
4	Billy R. Livesay	[6]
5	Donald Staab	[9]
6	Beau R. Wilson Jr.	[2] [3]

Colors in the list of coauthors