2004 |
21 | EE | Ian T. Foster,
Jerry Gieraltowski,
Scott Gose,
Natalia Maltsev,
Edward N. May,
Alex Rodriguez,
Dinanath Sulakhe,
A. Vaniachine,
Jim Shank,
Saul Youssef,
David Adams,
Richard Baker,
Wensheng Deng,
Jason Smith,
Dantong Yu,
Iosif Legrand,
Suresh Singh,
Conrad Steenberg,
Yang Xia,
M. Anzar Afaq,
Eileen Berman,
James Annis,
L. A. T. Bauerdick,
Michael Ernst,
Ian Fisk,
Lisa Giacchetti,
Gregory E. Graham,
Anne Heavey,
Joseph Kaiser,
Nickolai Kuropatkin,
Ruth Pordes,
Vijay Sekhri,
John Weigand,
Yujun Wu,
Keith Baker,
Lawrence Sorrillo,
John Huth,
Matthew Allen,
Leigh Grundhoefer,
John Hicks,
Fred Luehring,
Steve Peck,
Rob Quick,
Stephen Simms,
George Fekete,
Jan vandenBerg,
Kihyeon Cho,
Kihwan Kwon,
Dongchul Son,
Hyoungwoo Park,
Shane Canon,
Keith R. Jackson,
David E. Konerding,
Jason Lee,
Doug Olson,
Iowa Sakrejda,
Brian Tierney,
Mark Green,
Russ Miller,
James Letts,
Terrence Martin,
David Bury,
Catalin Dumitrescu,
Daniel Engh,
Robert Gardner,
Marco Mambelli,
Yuri Smirnov,
Jens-S. Vöckler,
Michael Wilde,
Yong Zhao,
Xin Zhao,
Paul Avery,
Richard Cavanaugh,
Bockjoo Kim,
Craig Prescott,
Jorge Luis Rodriguez,
Andrew Zahn,
Shawn McKee,
Christopher T. Jordan,
James E. Prewett,
Timothy L. Thomas,
Horst Severini,
Ben Clifford,
Ewa Deelman,
Larry Flon,
Carl Kesselman,
Gaurang Mehta,
Nosa Olomu,
Karan Vahi,
Kaushik De,
Patrick McGuigan,
Mark Sosebee,
Dan Bradley,
Peter Couvares,
Alan DeSmet,
Carey Kireyev,
Erik Paulson,
Alain Roy,
Scott Koranda,
Brian Moe,
Bobby Brown,
Paul Sheldon:
The Grid2003 Production Grid: Principles and Practice.
HPDC 2004: 236-245 |
2000 |
20 | | Will Moore,
Guido Gronthoud,
Keith Baker,
Maurice Lousberg:
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
ITC 2000: 95-104 |
1999 |
19 | | Keith Baker:
SIA Roadmaps: Sunset Boulevard for l_DDQ.
ITC 1999: 1121 |
1998 |
18 | EE | Keith Baker:
Spice up your life: simulate mixed-signal ICs!
ITC 1998: 1131 |
1997 |
17 | EE | Keith Baker,
Jos van Beers:
Shmoo Plotting: The Black Art of IC Testing.
IEEE Design & Test of Computers 14(3): 90-97 (1997) |
1996 |
16 | | Keith Baker,
Jos van Beers:
Shmoo Plots - the Black Art of IC Test.
ITC 1996: 932-933 |
1995 |
15 | | Keith Baker:
Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say?
ITC 1995: 299 |
14 | | Keith Baker,
T. F. Waayers,
F. G. M. Bouwman,
M. J. W. Verstraelen:
Plug & Play IDDQ Monitoring with QTAG.
ITC 1995: 739-749 |
13 | EE | Keith Baker,
Alan Hales:
Plug-and-Play IDDQ Testing for Test Fixtures.
IEEE Design & Test of Computers 12(3): 53-61 (1995) |
1994 |
12 | | Keith Baker:
QTAG: A Standard for Test Fixture Based IDDQ/ISSQ Monitors.
ITC 1994: 194-202 |
11 | | Keith Baker,
A. Bratt,
Andrew M. D. Richardson,
A. Welbers:
Development of a CLASS 1 QTAG Monitor.
ITC 1994: 213-222 |
10 | | R. J. A. Harvey,
Andrew M. D. Richardson,
Eric Bruls,
Keith Baker:
Analogue Fault Simulation Based on Layout-Dependent Fault Models.
ITC 1994: 641-649 |
9 | | Frank Bouwman,
Taco Zwemstra,
Sonny Hartanto,
Keith Baker,
Jan Koopmans:
Application of Joint Time-Frequency Analysis in Mixed-Signal Testing.
ITC 1994: 747-756 |
1993 |
8 | | M. M. A. van Rosmalen,
Keith Baker,
Eric Bruls,
Jochen A. G. Jess:
Parameter Monitoring: Advantages and Pitfalls.
ITC 1993: 115-124 |
1992 |
7 | | Keith Baker:
Time-to-Market: An Issue in Mixed-signal vs. Analogue.
ITC 1992: 254 |
6 | | Bas Verhelst,
Richard Morren,
Keith Baker:
Using EDIF for Transfer of Test Data: Practical Experience.
ITC 1992: 459-465 |
5 | | R. Mehtani,
M. De Jonghe,
Richard Morren,
Keith Baker:
Improving Total IC Design Quality Using Application Mode Testing.
ITC 1992: 866-872 |
1990 |
4 | EE | Kate Crennell,
Keith Baker:
5th Alvey vision Conference.
Image Vision Comput. 8(1): 2-3 (1990) |
1987 |
3 | EE | S. B. Tan,
K. Totton,
Keith Baker,
Prab Varma,
R. Porter:
A Fast Signature Simulation Tool for Built-In Self-Testing Circuits.
DAC 1987: 17-25 |
1985 |
2 | EE | Keith Baker:
Alvey computer vision and image interpretation research programmes.
Image Vision Comput. 3(4): 146-151 (1985) |
1984 |
1 | | Prab Varma,
Anthony P. Ambler,
Keith Baker:
An Analysis of the Economics of Self Test.
ITC 1984: 20-30 |