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Tonysheng Lin

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1985
3 Tonysheng Lin, Stephen Y. H. Su: VLSI Functional Test Pattern Generation: A Design and Implementation. ITC 1985: 922-929
2EETonysheng Lin, Stephen Y. H. Su: The S-Algorithm: A Promising Solution for Systematic Functional Test Generation. IEEE Trans. on CAD of Integrated Circuits and Systems 4(3): 250-263 (1985)
1984
1 Tonysheng Lin, Stephen Y. H. Su: Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. ITC 1984: 660-668

Coauthor Index

1Stephen Y. H. Su [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)