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1984 | ||
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2 | G. Siva Bushanam, Vance R. Harwood, Philip N. King, Roger D. Story: Measuring Thermal Rises Due to Digital Device Overdriving. ITC 1984: 400-425 | |
1983 | ||
1 | G. Siva Bushanam, H. Story: Safe Operating Zones for Digital In-Circuit Testing. ITC 1983: 804 |
1 | Vance R. Harwood | [2] |
2 | Philip N. King | [2] |
3 | H. Story | [1] |
4 | Roger D. Story | [2] |