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H. H. Kwan

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1984
1 Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams: A Built-In Test Methodology for VLSI Data Paths. ITC 1984: 327-337

Coauthor Index

1Charles R. Kime [1]
2J. K. Lemke [1]
3Gerald B. Williams [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)