| |
| 1984 | ||
|---|---|---|
| 2 | David M. Wu, Charles E. Radke, C. C. Beh: Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717 | |
| 1982 | ||
| 1 | C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku: Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42 | |
| 1 | K. H. Arya | [1] |
| 2 | Charles E. Radke | [1] [2] |
| 3 | E. Kofi Vida-Torku | [1] |
| 4 | David M. Wu | [2] |