| 1997 |
|---|
| 6 | | Douglas W. Raymond,
Dominic F. Haigh:
Why Automate Optical Inspection?
ITC 1997: 1033 |
| 5 | | Douglas W. Raymond:
Finding Opens with Optics.
ITC 1997: 277 |
| 1995 |
|---|
| 4 | | Douglas W. Raymond,
D. Eugene Wedge,
Philip J. Stringer,
Harold W. Ng,
Suzanne T. Jennings,
Craig T. Pynn,
Winsor Soule Jr.:
Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs.
ITC 1995: 561-568 |
| 1994 |
|---|
| 3 | | Douglas W. Raymond,
Philip J. Stringer,
Harold W. Ng,
Michael Mitsumata,
Robert Burk:
Goal-Directed Vector Generation Using Sample ICs.
ITC 1994: 802-810 |
| 2 | | Douglas W. Raymond,
Dominic F. Haigh,
Ray Bodick,
Barbara Ryan,
Dale McCombs:
Non-Volatile Programmable Devices and In-Circuit Test.
ITC 1994: 817-823 |
| 1984 |
|---|
| 1 | | Douglas W. Raymond:
In-Circuit Testability Factors: Shoot With a Rifle.
ITC 1984: 572-580 |
