| |
| 1985 | ||
|---|---|---|
| 3 | Tom Middleton: Recycling Functional Test Vectors: Techniques and Tools for Pattern Conversion. ITC 1985: 291-303 | |
| 1984 | ||
| 2 | S. Daniel Lee, Tom Middleton: Behavioral Simulation of VLSI Test System Aids Debugging and Analysis of Test Programs. ITC 1984: 614-620 | |
| 1983 | ||
| 1 | Tom Middleton: Functional Test Vector Generation for Digital LSI/VLSI Devices. ITC 1983: 682-691 | |
| 1 | S. Daniel Lee | [2] |