| 1992 |
|---|
| 16 | | Jacob Savir,
William H. McAnney:
A Multiple Seed Linear Feedback Shift Register.
IEEE Trans. Computers 41(2): 250-252 (1992) |
| 1991 |
|---|
| 15 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Testing for Coupled Cells in Random-Access Memories.
IEEE Trans. Computers 40(10): 1177-1180 (1991) |
| 1989 |
|---|
| 14 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Testing for Coupled Cells in Random-Access Memories.
ITC 1989: 439-451 |
| 1988 |
|---|
| 13 | | Jacob Savir,
William H. McAnney:
Identification of Failing Tests with Cycling Registers.
ITC 1988: 322-328 |
| 12 | | Jacob Savir,
William H. McAnney:
Random Pattern Testability of Delay Faults.
IEEE Trans. Computers 37(3): 291-300 (1988) |
| 11 | | William H. McAnney,
Jacob Savir:
Built-In Checking of the Correct Self-Test Signature.
IEEE Trans. Computers 37(9): 1142-1145 (1988) |
| 1987 |
|---|
| 10 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Fault Propagation Through Embedded Multiport Memories.
IEEE Trans. Computers 36(5): 592-602 (1987) |
| 1986 |
|---|
| 9 | | Jacob Savir,
William H. McAnney:
Random Pattern Testability of Delay Faults.
ITC 1986: 263-273 |
| 8 | | William H. McAnney,
Jacob Savir:
Built-In Checking of the Correct Self-Test Signature.
ITC 1986: 54-59 |
| 7 | | Paul H. Bardell,
William H. McAnney:
Pseudorandom Arrays for Built-In Tests.
IEEE Trans. Computers 35(7): 653-658 (1986) |
| 1985 |
|---|
| 6 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory.
ITC 1985: 100-105 |
| 5 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory.
ITC 1985: 106-114 |
| 4 | | Paul H. Bardell,
William H. McAnney:
Self-Test of Random Access Memories.
ITC 1985: 352-355 |
| 1984 |
|---|
| 3 | | William H. McAnney,
Paul H. Bardell,
V. P. Gupta:
Random Testing for Stuck-At Storage Cells in an Embedded Memory.
ITC 1984: 157-166 |
| 2 | | Paul H. Bardell,
William H. McAnney:
Parallel Pseudorandom Sequences for Built-In Test.
ITC 1984: 302-308 |
| 1982 |
|---|
| 1 | | Paul H. Bardell,
William H. McAnney:
Self-Testing of Multichip Logic Modules.
ITC 1982: 200-204 |
