| 1991 |
|---|
| 8 | EE | David M. Wu,
Charles E. Radke:
Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits.
DAC 1991: 291-295 |
| 1986 |
|---|
| 7 | | E. Kofi Vida-Torku,
James A. Monzel,
Charles E. Radke:
Performance Assurance of Memories Embedded in VLSI Chips.
ITC 1986: 154-160 |
| 6 | | David M. Wu,
Charles E. Radke,
J. P. Roth:
Statistical AC Test Coverage.
ITC 1986: 538-541 |
| 1984 |
|---|
| 5 | | David M. Wu,
Charles E. Radke,
C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits.
ITC 1984: 713-717 |
| 1982 |
|---|
| 4 | | C. C. Beh,
K. H. Arya,
Charles E. Radke,
E. Kofi Vida-Torku:
Do Stuck Fault Models Reflect Manufacturing Defects?
ITC 1982: 35-42 |
| 1966 |
|---|
| 3 | | Charles E. Radke:
Merge-Sort Analysis by Matrix Techniques.
IBM Systems Journal 5(4): 226-247 (1966) |
| 2 | | Charles E. Radke:
Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy
Information and Control 9(3): 279-284 (1966) |
| 1965 |
|---|
| 1 | | Charles E. Radke:
Enumeration of Strongly Connected Sequential Machines
Information and Control 8(4): 377-389 (1965) |
