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Charles E. Radke

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1991
8EEDavid M. Wu, Charles E. Radke: Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. DAC 1991: 291-295
1986
7 E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke: Performance Assurance of Memories Embedded in VLSI Chips. ITC 1986: 154-160
6 David M. Wu, Charles E. Radke, J. P. Roth: Statistical AC Test Coverage. ITC 1986: 538-541
1984
5 David M. Wu, Charles E. Radke, C. C. Beh: Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717
1982
4 C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku: Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42
1966
3 Charles E. Radke: Merge-Sort Analysis by Matrix Techniques. IBM Systems Journal 5(4): 226-247 (1966)
2 Charles E. Radke: Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy Information and Control 9(3): 279-284 (1966)
1965
1 Charles E. Radke: Enumeration of Strongly Connected Sequential Machines Information and Control 8(4): 377-389 (1965)

Coauthor Index

1K. H. Arya [4]
2C. C. Beh [4] [5]
3James A. Monzel [7]
4J. P. Roth [6]
5E. Kofi Vida-Torku [4] [7]
6David M. Wu [5] [6] [8]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)