| 1997 |
|---|
| 11 | | P. D. Bergstrom Jr.,
Mary Ann Ingram,
A. J. Vernon,
Joseph L. A. Hughes:
An Analysis Tool for Predicting Performance in an All-Optical Time Division Multiplexing Data Switch.
ICC (3) 1997: 1325-1329 |
| 10 | EE | Heebyung Yoon,
Abhijit Chatterjee,
Joseph L. A. Hughes:
Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits.
VLSI Design 1997: 393-397 |
| 1995 |
|---|
| 9 | | Koppolu Sasidhar,
Abhijit Chatterjee,
Vinod K. Agarwal,
Joseph L. A. Hughes:
Distributed Probabilistic Diagnosis of MCMs on Large Area.
ITC 1995: 208-216 |
| 1988 |
|---|
| 8 | EE | Joseph L. A. Hughes:
Multiple fault detection using single fault test sets.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 100-108 (1988) |
| 1986 |
|---|
| 7 | | Samiha Mourad,
Joseph L. A. Hughes,
Edward J. McCluskey:
Multiple Fault Detection in Parity Trees.
COMPCON 1986: 441-444 |
| 6 | | Samiha Mourad,
Joseph L. A. Hughes,
Edward J. McCluskey:
Stuck-At Fault Detection in Parity Trees.
FJCC 1986: 836-840 |
| 5 | | Joseph L. A. Hughes,
Edward J. McCluskey:
Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets.
ITC 1986: 368-374 |
| 1985 |
|---|
| 4 | | Joseph L. A. Hughes,
Samiha Mourad,
Edward J. McCluskey:
An Experimental Study Comparing 74LS181 Test Sets.
COMPCON 1985: 384-387 |
| 1984 |
|---|
| 3 | | Joseph L. A. Hughes,
Edward J. McCluskey:
An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets.
ITC 1984: 52-58 |
| 2 | | Joseph L. A. Hughes,
Edward J. McCluskey,
David J. Lu:
Design of Totally Self-Checking Comparators with an Arbitrary Number of Inputs.
IEEE Trans. Computers 33(6): 546-550 (1984) |
| 1982 |
|---|
| 1 | | Joseph L. A. Hughes:
Implementing Control-Flow Structures in Dataflow Programs.
COMPCON 1982: 87-90 |
